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Mass-spectrometer MTH-350GP

The mass-spectrometer МТH-350GP is intended for analysis of impurities content in uranium hexafluoride. The device is created on the ground of the basic analytical part with the use of the unified electronic units of mass-spectrometers of MTI-350 series.


Features:

The mass-spectrometer МТH-350GP is equipped with the following assemblies providing execution of specific measuring functions:

  • ion source with a minimum mass discrimination;
  • ion collector with a wide dynamic range;
  • system of samples preparation and input with the device of impurities concentration.

    Mass-spectrometer provides the analysis of chemically aggressive substances in order to check impurities in the gaseous uranium hexafluoride.


    A system of samples preparation and input, made as a separate stand, is used in МТH-350GP. The samples input system includes three channels:

  • direct analysis channel;
  • channel of organic impurities analysis with the use of sodium fluoride;
  • channel of inorganic compounds analysis with the use of the cryogenic sublimator.

    The use of the selective transmittance of substances on the basis of the cryogenic sublimator makes it possible to decrease considerably the threshold of impurities detection in different elements: boron (BF3); silicon(SiF4); phosphorus (PF5, POF3); sulfur (SF6, SOF2, SO2F2); chrome (CrO2F2); molybdenum (MoF6); wolframium (WF6); rhenium (ReF6); light impurities – hydrogen fluoride (HF), air components (N2, O2, Ar, CO2), as well as light organic compounds regulated by the domestic technical conditions and ASTM specifications.



    Characteristics of МТH-350GP

    Resolving capacity   not less than 1000 
    Instability at the peak slope for 20 minutes   not more than 2•10-5 
    Upper boundary of mass range   not less than 450 amu 
    Dynamic range of registration channel   not less than 1•108 
    Limit of impurities detection at determination of their content by the direct method   not more than 1•10-2% mol 
    Limit of impurities detection with the use of the impurities concentration   not more than 1•10-5% mol 
    Relative standard deviation of the unit measurement of the impurity component content in uranium hexafluoride at determination of impurities content by the direct method  30% 
    Relative standard deviation of the unit measurement of the impurity component content in uranium hexafluoride with the use of the impurities concentration  22% 
    Full average service life of the mass-spectrometer   not less than 10 years%